BS EN 60749-37-2008 半导体装置.机械和气候试验方法.使用加速计的电路板级落锤试验方法
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【英文标准名称】:Semiconductordevices—Mechanicalandclimatictestmethods—Part37:Boardleveldroptestmethodusinganaccelerometer
【原文标准名称】:半导体装置.机械和气候试验方法.使用加速计的电路板级落锤试验方法
【标准号】:BSEN60749-37-2008
【标准状态】:现行
【国别】:英国
【发布日期】:2008-05-30
【实施或试行日期】:2008-05-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:加速测量仪;加速计;应用;壳体;气候;气候试验;组件;定义;设计;跌落试验;电气工程;电子的;电子设备及元件;故障分析;故障标准;仪器;机械工人;机械测试;印制电路板;半导体器件;半导体;标准化;测试
【英文主题词】:Accelerationmeasuringinstruments;Accelerometers;Applications;Bodies;Climatic;Climatictests;Components;Definition;Definitions;Design;Droptests;Electricalengineering;Electronic;Electronicequipmentandcomponents;Failureanalysis;Failurecriterion;Instruments;Mechanic;Mechanicaltesting;Printed-circuitboards;Semiconductordevices;Semiconductors;Standardizations;Testing
【摘要】:ThispartofIEC60749providesatestmethodthatisintendedtoevaluateandcomparedropperformanceofsurfacemountelectroniccomponentsforhandheldelectronicproductapplicationsinanacceleratedtestenvironment,whereexcessiveflexureofacircuitboardcausesproductfailure.Thepurposeistostandardizethetestboardandtestmethodologytoprovideareproducibleassessmentofthedroptestperformanceofsurface-mountedcomponentswhileproducingthesamefailuremodesnormallyobservedduringproductleveltest.Thepurposeofthisstandardistoprescribeastandardizedtestmethodandreportingprocedure.Thisisnotacomponentqualificationtestandisnotmeanttoreplaceanysystemleveldroptestthatmaybeneededtoqualifyaspecifichandheldelectronicproduct.ThestandardisnotmeanttocoverthedroptestrequiredtosimulateshippingandhandlingrelatedshockofelectroniccomponentsorPCBassemblies.TheserequirementsarealreadyaddressedintestmethodssuchasIEC60749-10.Themethodisapplicabletobothareaarrayandperimeter-leadedsurfacemountedpackages.Thistestmethodusesanaccelerometertomeasurethemechanicalshockdurationandmagnitudeappliedwhichisproportionaltothestressonagivencomponentmountedonastandardboard.ThetestmethoddescribedinthefutureIEC60749-401usesstraingaugetomeasurethestrainandstrainrateofaboardinthevicinityofacomponent.Thedetailedspecificationstateswhichtestmethodistobeused.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:22P.;A4
【正文语种】:英语
【原文标准名称】:半导体装置.机械和气候试验方法.使用加速计的电路板级落锤试验方法
【标准号】:BSEN60749-37-2008
【标准状态】:现行
【国别】:英国
【发布日期】:2008-05-30
【实施或试行日期】:2008-05-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:加速测量仪;加速计;应用;壳体;气候;气候试验;组件;定义;设计;跌落试验;电气工程;电子的;电子设备及元件;故障分析;故障标准;仪器;机械工人;机械测试;印制电路板;半导体器件;半导体;标准化;测试
【英文主题词】:Accelerationmeasuringinstruments;Accelerometers;Applications;Bodies;Climatic;Climatictests;Components;Definition;Definitions;Design;Droptests;Electricalengineering;Electronic;Electronicequipmentandcomponents;Failureanalysis;Failurecriterion;Instruments;Mechanic;Mechanicaltesting;Printed-circuitboards;Semiconductordevices;Semiconductors;Standardizations;Testing
【摘要】:ThispartofIEC60749providesatestmethodthatisintendedtoevaluateandcomparedropperformanceofsurfacemountelectroniccomponentsforhandheldelectronicproductapplicationsinanacceleratedtestenvironment,whereexcessiveflexureofacircuitboardcausesproductfailure.Thepurposeistostandardizethetestboardandtestmethodologytoprovideareproducibleassessmentofthedroptestperformanceofsurface-mountedcomponentswhileproducingthesamefailuremodesnormallyobservedduringproductleveltest.Thepurposeofthisstandardistoprescribeastandardizedtestmethodandreportingprocedure.Thisisnotacomponentqualificationtestandisnotmeanttoreplaceanysystemleveldroptestthatmaybeneededtoqualifyaspecifichandheldelectronicproduct.ThestandardisnotmeanttocoverthedroptestrequiredtosimulateshippingandhandlingrelatedshockofelectroniccomponentsorPCBassemblies.TheserequirementsarealreadyaddressedintestmethodssuchasIEC60749-10.Themethodisapplicabletobothareaarrayandperimeter-leadedsurfacemountedpackages.Thistestmethodusesanaccelerometertomeasurethemechanicalshockdurationandmagnitudeappliedwhichisproportionaltothestressonagivencomponentmountedonastandardboard.ThetestmethoddescribedinthefutureIEC60749-401usesstraingaugetomeasurethestrainandstrainrateofaboardinthevicinityofacomponent.Thedetailedspecificationstateswhichtestmethodistobeused.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:22P.;A4
【正文语种】:英语
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